Die including a high voltage capacitor

ABSTRACT

According to an embodiment of the invention there may be provided a die that may include a first capacitor layer that comprises (a) a first capacitor conductive plate, and (b) a first capacitor layer dielectric material that partially surrounds the first capacitor conductive plate; a first conductor; an intermediate metal layer that comprises (a) an intermediate metal layer conductor that is made of Copper, and (b) an intermediate metal layer dielectric material that partially surrounds the intermediate metal layer conductor; wherein the first conductor is positioned between a substrate of the die and the intermediate metal layer; a redistribution layer that comprises (a) a redistribution layer conductor that is electrically coupled to an interface pad of the die, (b) a second capacitor conductive plate, and (c) a redistribution layer dielectric material that partially surrounds the redistribution layer conductor and the second capacitor conductive plate; wherein a certain portion of the intermediate metal layer dielectric material is positioned between the first and second capacitor conductive plates; wherein at least the certain portion of the intermediate metal layer dielectric material, the first capacitor conductive plate and the second capacitor conductive plate form a high voltage capacitor; and wherein the intermediate metal layer conductor is configured to supply power to a group of transistors of the die while the first conductor is configured to supply power only to a sub-group of the transistors of the die.

BACKGROUND OF THE INVENTION

A high voltage power management integrated circuit (PMIC) requires aunique layout and design techniques in order to transmit control signalsfrom a low voltage regime to the high voltage domain and vice versa.This is especially acute when the high voltages are of the order ofthousands of volts on the edge or beyond what silicon can sustain.

Signal transmission across high voltage isolation can be materialized byoptical, inductive or capacitive or direct link via a high voltagedevice. At high voltages, where a direct device link may not be possibleor desirable, the capacitive solution are usually simpler than theothers but often used requires an off-chip high voltage cap that isexpensive and bulky.

SUMMARY

According to an embodiment of the invention there may be provided a diethat may include a die that may include a first capacitor layer that mayinclude (a) a first capacitor conductive plate, and (b) a firstcapacitor layer dielectric material that partially surrounds the firstcapacitor conductive plate; a first conductor; an intermediate metallayer that may include (a) an intermediate metal layer conductor thatmay be made of Copper, and (b) an intermediate metal layer dielectricmaterial that partially surrounds the intermediate metal layerconductor; wherein the first conductor may be positioned between asubstrate of the die and the intermediate metal layer; a redistributionlayer that may include (a) a redistribution layer conductor that may beelectrically coupled to an interface pad of the die, (b) a secondcapacitor conductive plate, and (c) a redistribution layer dielectricmaterial that partially surrounds the redistribution layer conductor andthe second capacitor conductive plate; wherein a certain portion of theintermediate metal layer dielectric material may be positioned betweenthe first and second capacitor conductive plates; wherein at least thecertain portion of the intermediate metal layer dielectric material, thefirst capacitor conductive plate and the second capacitor conductiveplate form a high voltage capacitor; and wherein the intermediate metallayer conductor may be configured to supply power to a group oftransistors of the die while the first conductor may be configured tosupply power only to a sub-group of the transistors of the die.

The die may include complementary metal oxide transistors, bipolartransistor and double diffused metal oxide transistors.

The first capacitor layer may be a first metal layer; wherein the firstcapacitor conductive plate may be made of metal; and wherein the firstcapacitor layer dielectric material partially surrounds the firstconductor.

The first capacitor layer may be positioned between the substrate of thedie and the first conductor and wherein the first capacitor conductiveplate may include a non-metal conductive material.

The non-metal conductive material may be silicide.

The thickness of the intermediate metal layer exceeds 30000 Angstrom.

The ratio between a thickness of the intermediate metal layer and athickness of the first capacitor layer exceeds three.

The thickness of the intermediate metal layer may be dictated by a powerconsumption of the group of transistors.

The thickness of the intermediate metal layer may be set regardless ofany electrical parameter of the high voltage capacitor.

The die may be manufactured by a manufacturing process that may includeapplying a design rule that dictates a thickness of the intermediatemetal layer as a function of a power consumed by the group oftransistors.

The die may be manufactured by a manufacturing process that may includeapplying a design rule that dictates a thickness of the intermediatemetal layer regardless of any electrical parameter of the high voltagecapacitor.

The die may be manufactured by a complementary metal oxide (CMOS),bipolar and double diffused metal oxide (DMOS) manufacturing process.

According to an embodiment of the invention there may be provided amethod for manufacturing a die, the method may include: manufacturing asubstrate and a group of transistors; manufacturing a first capacitorlayer that may include (a) a first capacitor conductive plate, and (b) afirst capacitor layer dielectric material that partially surrounds thefirst capacitor conductive plate; manufacturing an intermediate metallayer that may include (a) an intermediate metal layer conductor thatmay be made of Copper, and (b) an intermediate metal layer dielectricmaterial that partially surrounds the intermediate metal layerconductor; wherein the manufacturing of the intermediate metal layer maybe preceded by manufacturing a first conductor; manufacturing aredistribution layer that may include (a) a redistribution layerconductor that may be electrically coupled to an interface pad of thedie, (b) a second capacitor conductive plate, and (c) a redistributionlayer dielectric material that partially surrounds the redistributionlayer conductor and the second capacitor conductive plate; wherein acertain portion of the intermediate metal layer dielectric material maybe positioned between the first and second capacitor conductive plates;wherein at least the certain portion of the intermediate metal layerdielectric material, the first capacitor conductive plate and the secondcapacitor conductive plate form a high voltage capacitor; and whereinthe intermediate metal layer conductor may be configured to supply powerto a group of transistors of the die while the first conductor may beconfigured to supply power only to a sub-group of the transistors of thedie.

The manufacturing of the die may include applying a design rule thatdictates a thickness of the intermediate metal layer as a function of apower consumed by the group of transistors.

The manufacturing of the die may include applying a design rule thatdictates a thickness of the intermediate metal layer regardless of anyelectrical parameter of the high voltage capacitor.

According to an embodiment of the invention there may be provided amethod for designing a die, the method may include: designing a die thatmay include a first capacitor layer that may include (a) a firstcapacitor conductive plate, and (b) a first capacitor layer dielectricmaterial that partially surrounds the first capacitor conductive plate;a first conductor; an intermediate metal layer that may include (a) anintermediate metal layer conductor that may be made of Copper, and (b)an intermediate metal layer dielectric material that partially surroundsthe intermediate metal layer conductor; wherein the first conductor maybe positioned between a substrate of the die and the intermediate metallayer; a redistribution layer that may include (a) a redistributionlayer conductor that may be electrically coupled to an interface pad ofthe die, (b) a second capacitor conductive plate, and (c) aredistribution layer dielectric material that partially surrounds theredistribution layer conductor and the second capacitor conductiveplate; wherein a certain portion of the intermediate metal layerdielectric material may be positioned between the first and secondcapacitor conductive plates; wherein at least the certain portion of theintermediate metal layer dielectric material, the first capacitorconductive plate and the second capacitor conductive plate form a highvoltage capacitor; and wherein the intermediate metal layer conductormay be configured to supply power to a group of transistors of the diewhile the first conductor may be configured to supply power only to asub-group of the transistors of the die; and wherein the designing mayinclude at least one out of: setting a thickness of the intermediatemetal layer regardless of any electrical parameter of the high voltagecapacitor; and determining the thickness of the intermediate metal layerin response to a power consumed by the group of transistors.

BRIEF DESCRIPTION OF THE DRAWINGS

The subject matter regarded as the invention is particularly pointed outand distinctly claimed in the concluding portion of the specification.The invention, however, both as to organization and method of operation,together with objects, features, and advantages thereof, may best beunderstood by reference to the following detailed description when readwith the accompanying drawings in which:

FIG. 1 is a cross sectional view of a die according to an embodiment ofthe invention;

FIG. 2 is a cross sectional view of a die according to an embodiment ofthe invention;

FIG. 3 illustrates a die according to an embodiment of the invention;

FIG. 4 illustrates a portion of a die according to an embodiment of theinvention;

FIG. 5 illustrates a method according to an embodiment of the invention;

FIG. 6 illustrates a method according to an embodiment of the invention;and

FIG. 7 is a cross sectional view of a die according to an embodiment ofthe invention.

It will be appreciated that for simplicity and clarity of illustration,elements shown in the figures have not necessarily been drawn to scale.For example, the dimensions of some of the elements may be exaggeratedrelative to other elements for clarity. Further, where consideredappropriate, reference numerals may be repeated among the figures toindicate corresponding or analogous elements.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

In the following detailed description, numerous specific details are setforth in order to provide a thorough understanding of the invention.However, it will be understood by those skilled in the art that thepresent invention may be practiced without these specific details. Inother instances, well-known methods, procedures, and components have notbeen described in detail so as not to obscure the present invention.

The subject matter regarded as the invention is particularly pointed outand distinctly claimed in the concluding portion of the specification.The invention, however, both as to organization and method of operation,together with objects, features, and advantages thereof, may best beunderstood by reference to the following detailed description when readwith the accompanying drawings.

Because the illustrated embodiments of the present invention may for themost part, be implemented using electronic components and circuits knownto those skilled in the art, details will not be explained in anygreater extent than that considered necessary as illustrated above, forthe understanding and appreciation of the underlying concepts of thepresent invention and in order not to obfuscate or distract from theteachings of the present invention.

The terms “high voltage” and “low voltage” refer to different levels ofvoltage. Low voltage usually refers to voltages that may not exceed fewvolts (for example—5 volts and below). High voltage usually refers tovoltages that exceed few hundred volts (for example—200 volts andabove)—and may exceed thousands of volts.

The terms “high power” and “low power” refer to different levels ofpower. Low power usually refers to power levels that do not exceed 1Watt while high power usually refers to power level that exceeds 10Watt.

The terms “thick” and “thin” refer to different levels of thickness.Thin usually refers to a thickness that does not exceed 10000 Angstromand usually ranges between 5500 and 8500 Angstrom. Thick usually refersto thicknesses of few tens of thousands Angstrom and usually may exceed30000 Angstrom.

According to an embodiment of the invention there is provided a methodthat allows integrating a high voltage capacitor in an existingmanufacturing process that incorporates a thick metal layer without anyadded cost.

Three prior art dies (low voltage control die, level shifting dies andhigh voltage control circuit die) can be replaced by a double diesolution (integrated HV cap and HV circuit) or single die solution whenused on SOI wafers.

FIG. 1 is a cross sectional view of a die 11 according to an embodimentof the invention.

Table 1 illustrates the layers of the die—from top to bottom, and theircomponents:

Part of high voltage Layer Elements of the layer capacitor 50 Firstlayer 21 First layer dielectric material Second layer 22 RDL conductor42, first First capacitor capacitor conductive plate conductive plate 5252, RDL dielectric material 32 (also referred to as second passivationlayer) Third layer 23 Dielectric material 33 (also At least portion 53of referred to as first dielectric material 33 passivation layer), via43. Fourth layer Intermediate metal layer At least portion 54 of (alsoreferred conductor 44 that is intermediate metal layer to asintermediate partially surrounded by dielectric material 34 metal layer)24 intermediate metal layer dielectric material 34 Fifth layer 25 Vias45 that are partially At least portion 55 of surrounded by fifth layerfifth layer dielectric dielectric material 35 material 35 Sixth layer 26Metal conductors 46 that At least portion 56 of are partially surroundedby sixth layer dielectric sixth layer dielectric material 36 material 36Seventh layer 27 Vias 47 that are partially At least portion 57 ofsurrounded by seventh layer seventh layer dielectric dielectric material37 material 37 Eighth layer Metal conductors 48 and Second capacitor(also referred second capacitor conductive conductive plate 58 to asfirst plate 58 that are partially capacitor layer) surrounded by first28 capacitor layer dielectric material 38 Ninth layer 29 Vias 49 and atransistor 62 that includes a polysilicon region 61, vias 49 andtransistor 62 are partially surrounded by ninth layer dielectricmaterial 39 Substrate 71 Substrate 73 is illustrated as includingshallow trenches insulator (STI) 72.

In FIG. 1 the first capacitor layer is a metal layer and the secondcapacitor conductive plate is made of metal.

The different layers 21-29 are manufacture done after the other.

PMICs that are designed for high currents spreading from 1 A to 20 Aneed to have thick metal layers that can support the current densityneeded at the source and drain of high power transistors without toomuch area penalty.

Intermediate metal layer 24 is a thick metal layer that includes one ormore thick conductors (such as intermediate metal layer conductor 44)that has a reduced resistance thereby improving the power efficiency ofthe die.

The intermediate metal layer conductor 44 may be coupled in parallel tomultiple transistors via multiple thin metal conductors.

Intermediate metal layer 24 is termed “intermediate” because it ispositioned between first and second conductive plates of the highvoltage capacitor.

Intermediate metal layer 24 includes intermediate metal layer dielectricmaterial 34 that is thick. The thickness of the intermediate metal layerdielectric material 34 may be dictated by the thickness of theintermediate metal layer conductor 44—which may dictated by the currentthat should be supplied by the intermediate metal layer conductor 44 andmay be determined regardless of any parameter of the high voltagecapacitor 50.

Accordingly—the manufacturing of the high voltage capacitor 50 does notrequire to modify an existing manufacturing process (for example—byartificially thickening the thickness of one or more layer) as it mayutilize the thick intermediate metal layer dielectric material.

The intermediate metal layer conductor 44 can be made of Copper (Cu) andhave a sheet resistance 5.5 Mega Ohm/square unit which is much smallerthan the sheet resistance of conductors of thin metal layers.

The intermediate metal layer conductor 44 may be manufactured by aCopper process that may start with depositing a thick dielectric stackfollowed by a photo/etch process to form trenches for the metal wires. Aseed layer is deposited over the dielectric and in the trenches,following the trenches may be filled by a standard electroplatingtechnique.

According to an embodiment of the invention the high voltage capacitor50 is able to withstand very high voltages, it is linear (in between twometal plates) with low parasitic capacitance to the substrate.

In comparison to conventional level-up shifter which dissipates power oneach switching cycle, using a high-power capacitor burns much less powerto send the signals.

Using a high-power capacitor provides a relatively simple way forlevel-down shifting without the need for high side ldmos transistors.This can save the overhead the designer has to keep in the dead timezone in the lack of down shifter. As a result the power switchingefficiency can improve. Without the level shift down it is an open loop,the designer has to guess when the high side switch is turned off beforeturning on the low side switch. As a result the designer will use longerdead time in between switches which correlates to more power losses ineach cycle.

FIG. 1 illustrates:

-   -   a. Via 42 as being connected between RDL conductor 42 and        intermediate metal layer conductor 44.    -   b. Three vias 45 of fifth layer 25—wherein each via is connected        between intermediate metal layer conductor 44 and a metal        conductor out of the three metal conductors 46 of sixth layer        26.    -   c. Three vias 47 of seventh layer 27—wherein each via is        connected between a metal conductor out of the three metal        conductors 46 of sixth layer 26 and a metal conductor out of the        three metal conductors 48 of eighth layer 28.    -   d. Three vias 49 of ninth layer 27—wherein each via is        connected, at one end to a metal conductor out of the three        metal conductors 46 of eighth layer 28. The other ends of two        vias of the ninth layers are connected to substrate 73 while        another end of a via 49 is connected to transistor 62.

The number of vias and conductors per layer may differ from thoseillustrated in FIG. 1.

Some of the thin metal conductors of thin metal layers may be used forrouting logic and analog circuits of the die. FIGS. 1 and 2 illustratetwo thin metal layers referred to as sixth layer 26 and eighth layer 28.The number of thin metal layers may differ from two. It may be one orexceed two.

FIG. 1 is a cross section along a certain plane. The intermediate metallayer conductor 44 is also coupled to multiple thin conductors and viasthat are positioned outside of the plane—and extend “outside” FIG. 1.

The die may include a thin etch stopping layer of SiN4 having athickness of about 500 Angstrom. FIG. 7 illustrates such an etchstopping layer (21′). Such an etch stopping layer may also be includedin the die of FIG. 2.

The third layer 23 maybe a thick passivation layer of ˜350 nm. The thickpassivation layer may be opened for pad opening and for via 43.

The RDL conductor 42 can be made of 12000 Angstrom Aluminum that isdeposited over a 50 nm Ta barrier layer. The Ta is first deposited as abarrier followed by a deposition of Al of the RDL). The Aluminum may bepatterned to be used for pad areas and as redistribution (RDL) layer.

The RDL layer may be used in the integrated circuits for:

-   -   a. Conducting layer for routing devices.    -   b. Top plate for the HV capacitor.    -   c. Pad for wire bonds.

The second passivation layer 32 may be made of 350 nm SiO2 and 450 nmSIN.

The first layer 21 may be a thick polyimide layer. This thick polyimidelayer helps to prevent voltage spikes between boding wires and alsorelieve the electric fields and get higher voltage blocking from thehigh voltage capacitor.

Non-limiting examples of the thickness of various layers are providedbelow:

-   -   a. Third layer 23—about 5000 Angstrom.    -   b. Intermediate metal layer 24—about 35000 Angstrom.    -   c. Fifth layer 25—about 8000 Angstrom.    -   d. Sixth layer 26—about 5500 Angstrom.    -   e. Seventh layer 27—about 8000 Angstrom.    -   f. Eighth layer 28—about 5500 Angstrom.    -   g. Ninth layer 29—about 5000 Angstrom.

The high voltage capacitor 50 is able to work continually at DC levelsof about 200˜1000V and can withstand short voltage spikes in the orderof 6 KV.

As a rule of thumb—assuming that the distance (in microns) between thecapacitor conductive plates is D then the high voltage capacitor maywork continually at DC levels of D*100 Volts and may withstand shortpulses of up to D*1000 Volts.

FIG. 2 is a cross sectional view of a die 11 according to an embodimentof the invention.

In FIG. 2 the first capacitor layer is a dielectric layer (ninth layer29) and the second capacitor conductive plate is made of a non-metalconductive material such as silicide 59 deposited on polysilicon 59′.

Table 1 illustrates the layers of the die—from top to bottom, and theircomponents:

Part of high voltage Layer Elements of the layer capacitor 50 Firstlayer 21 First layer dielectric material Second layer 22 RDL conductor42, first First capacitor capacitor conductive plate conductive plate52, RDL dielectric material 52 32 (also referred to as secondpassivation layer) Third layer 23 Dielectric material 33 (also At leastportion referred to as first 53 of dielectric passivation layer), via43. material 33 Fourth layer Intermediate metal layer At least portion(also referred conductor 44 that is 54 of intermediate to as partiallysurrounded by metal layer intermediate intermediate metal layerdielectric material metal layer) 24 dielectric material 34 34 Fifthlayer 25 Vias 45 that are At least portion partially surrounded by 55 offifth layer fifth layer dielectric dielectric material material 35 35Sixth layer 26 Metal conductors 46 that At least portion 56 arepartially surrounded of sixth layer by sixth layer dielectric dielectricmaterial material 36 36 Seventh layer 27 Vias 47 that are partially Atleast portion 57 surrounded by seventh layer of seventh layer dielectricmaterial 37 dielectric material 37 Eighth layer 28 Metal conductors 48is partially surrounded by eight layer dielectric material 38 Ninthlayer Vias 49, a transistor 62 that Second capacitor (also referredincludes a polysilicon conductive plate 59′ to as first region 61, andsecond capacitor layer) capacitor conductive 29 plate 59′ (such as asilicide layer form on top of polysilicon layer 59), wherein vias 49,transistor 62 and second capacitor conductive plate 59′ are partiallysurrounded by ninth layer dielectric material 39. The polysilicon layer59 contacts the STI 72 of substrate 71. Substrate 71 Substrate 73 isillustrated as including STI 72.

FIG. 3 illustrates a die 10 according to an embodiment of the invention.

Die includes high voltage capacitor 50 and is coupled between a highvoltage circuit 401 and a low voltage circuit 402 that is illustrated asincluding a CMOS transistor 411, a bipolar transistor 412 and a DMOStransistor 413. Although die 10 is manufactured using a Bipolar CMOS andDMOS (BCD) manufacturing process—die 10 does not necessarily include allthree types of transistors.

FIG. 4 is a top view of a portion of an intermediate metal layerconductor 44 and of various elements 501 and 502 that are connected tothe intermediate metal layer conductor 44 according to an embodiment ofthe invention.

FIG. 4 also illustrates a plane A-A that corresponds to the crosssection plane through which the cross sectional vies of FIGS. 1 and 2were taken.

FIG. 4 illustrates three rows of elements—corresponding to the threedies and three thin metal conductors per fifth till ninth layers ofFIGS. 1 and 2. The two external rows include elements 501 while theinternal row includes elements 502.

Each element 501 includes via 45, metal conductor 46, via 47, metalconductor 48, via 49 and transistor 62.

Each element 502 includes via 45, metal conductor 46, via 47, metalconductor 48, and via 49.

Intermediate metal layer conductor 44 supplied power to a group of eighttransistors 62 while each one of metal conductors 46 and 48 areconnected to a sub-group of transistors that includes up to a singletransistor.

FIG. 5 illustrates method 500 according to an embodiment of theinvention.

Method 500 may include a sequence of steps that may include steps 510,520, 530 and 540.

Manufacturing (510) a substrate and a group of transistors.

Manufacturing (520) a first capacitor layer that comprises (a) a firstcapacitor conductive plate, and (b) a first capacitor layer dielectricmaterial that partially surrounds the first capacitor conductive plate.Step 520 may include manufacturing a first conductor or may be followedby manufacturing the first conductor.

Manufacturing (530) an intermediate metal layer that comprises (a) anintermediate metal layer conductor that is made of Copper, and (b) anintermediate metal layer dielectric material that partially surroundsthe intermediate metal layer conductor. The intermediate metal layerconductor is configured to supply power to a group of transistors of thedie while the first conductor is configured to supply power only to asub-group of the transistors of the die.

Manufacturing (540) a redistribution layer that comprises (a) aredistribution layer conductor that is electrically coupled to aninterface pad of the die, (b) a second capacitor conductive plate, and(c) a redistribution layer dielectric material that partially surroundsthe redistribution layer conductor and the second capacitor conductiveplate. A certain portion of the intermediate metal layer dielectricmaterial is positioned between the first and second capacitor conductiveplates. At least the certain portion of the intermediate metal layerdielectric material, the first capacitor conductive plate and the secondcapacitor conductive plate form a high voltage capacitor.

Method 500 may include applying (501) a design rule that dictates athickness of the intermediate metal layer as a function of a powerconsumed by the group of transistors.

Method 500 may include applying (502) a design rule that dictates athickness of the intermediate metal layer regardless of any electricalparameter of the high voltage capacitor.

FIG. 6 illustrates method 600 according to an embodiment of theinvention.

Method 600 may include step 610 of designing a die that comprises afirst capacitor layer that comprises (a) a first capacitor conductiveplate, and (b) a first capacitor layer dielectric material thatpartially surrounds the first capacitor conductive plate; a firstconductor; an intermediate metal layer that comprises (a) anintermediate metal layer conductor that is made of Copper, and (b) anintermediate metal layer dielectric material that partially surroundsthe intermediate metal layer conductor; wherein the first conductor ispositioned between a substrate of the die and the intermediate metallayer; a redistribution layer that comprises (a) a redistribution layerconductor that is electrically coupled to an interface pad of the die,(b) a second capacitor conductive plate, and (c) a redistribution layerdielectric material that partially surrounds the redistribution layerconductor and the second capacitor conductive plate; wherein a certainportion of the intermediate metal layer dielectric material ispositioned between the first and second capacitor conductive plates;wherein at least the certain portion of the intermediate metal layerdielectric material, the first capacitor conductive plate and the secondcapacitor conductive plate form a high voltage capacitor; and whereinthe intermediate metal layer conductor is configured to supply power toa group of transistors of the die while the first conductor isconfigured to supply power only to a sub-group of the transistors of thedie.

Step 610 may include at least one step of step 611 of setting athickness of the intermediate metal layer regardless of any electricalparameter of the high voltage capacitor; and step 612 of determining thethickness of the intermediate metal layer in response to a powerconsumed by the group of transistors.

There may be provided a die as illustrated in this application that isdesigned by method 600 and/or manufactured by method 500.

Any reference to any of the terms “comprise”, “comprises”, “comprising”“including”, “may include” and “includes” may be applied to any of theterms “consists”, “consisting”, “consisting essentially of”. Forexample—any of the rectifying circuits illustrated in any figure mayinclude more components that those illustrated in the figure, only thecomponents illustrated in the figure or substantially only thecomponents illustrate din the figure.

In the foregoing specification, the invention has been described withreference to specific examples of embodiments of the invention. It will,however, be evident that various modifications and changes may be madetherein without departing from the broader spirit and scope of theinvention as set forth in the appended claims.

Moreover, the terms “front,” “back,” “top,” “bottom,” “over,” “under”and the like in the description and in the claims, if any, are used fordescriptive purposes and not necessarily for describing permanentrelative positions. It is understood that the terms so used areinterchangeable under appropriate circumstances such that theembodiments of the invention described herein are, for example, capableof operation in other orientations than those illustrated or otherwisedescribed herein.

Those skilled in the art will recognize that the boundaries betweenlogic blocks are merely illustrative and that alternative embodimentsmay merge logic blocks or circuit elements or impose an alternatedecomposition of functionality upon various logic blocks or circuitelements. Thus, it is to be understood that the architectures depictedherein are merely exemplary, and that in fact many other architecturescan be implemented which achieve the same functionality.

Any arrangement of components to achieve the same functionality iseffectively “associated” such that the desired functionality isachieved. Hence, any two components herein combined to achieve aparticular functionality can be seen as “associated with” each othersuch that the desired functionality is achieved, irrespective ofarchitectures or intermedial components. Likewise, any two components soassociated can also be viewed as being “operably connected,” or“operably coupled,” to each other to achieve the desired functionality.

Furthermore, those skilled in the art will recognize that boundariesbetween the above described operations merely illustrative. The multipleoperations may be combined into a single operation, a single operationmay be distributed in additional operations and operations may beexecuted at least partially overlapping in time. Moreover, alternativeembodiments may include multiple instances of a particular operation,and the order of operations may be altered in various other embodiments.

Also for example, in one embodiment, the illustrated examples may beimplemented as circuitry located on a single integrated circuit orwithin a same device. Alternatively, the examples may be implemented asany number of separate integrated circuits or separate devicesinterconnected with each other in a suitable manner.

However, other modifications, variations and alternatives are alsopossible. The specifications and drawings are, accordingly, to beregarded in an illustrative rather than in a restrictive sense.

In the claims, any reference signs placed between parentheses shall notbe construed as limiting the claim. The word ‘comprising’ does notexclude the presence of other elements or steps then those listed in aclaim. Furthermore, the terms “a” or “an,” as used herein, are definedas one or more than one. Also, the use of introductory phrases such as“at least one” and “one or more” in the claims should not be construedto imply that the introduction of another claim element by theindefinite articles “a” or “an” limits any particular claim containingsuch introduced claim element to inventions containing only one suchelement, even when the same claim includes the introductory phrases “oneor more” or “at least one” and indefinite articles such as “a” or “an.”The same holds true for the use of definite articles. Unless statedotherwise, terms such as “first” and “second” are used to arbitrarilydistinguish between the elements such terms describe. Thus, these termsare not necessarily intended to indicate temporal or otherprioritization of such elements.

While certain features of the invention have been illustrated anddescribed herein, many modifications, substitutions, changes, andequivalents will now occur to those of ordinary skill in the art. It is,therefore, to be understood that the appended claims are intended tocover all such modifications and changes as fall within the true spiritof the invention.

We claim:
 1. A die, comprising: a first capacitor layer that comprises(a) a first capacitor conductive plate, and (b) a first capacitor layerdielectric material that partially surrounds the first capacitorconductive plate; a first conductor; an intermediate metal layer thatcomprises (a) an intermediate metal layer conductor that is made ofCopper, and (b) an intermediate metal layer dielectric material thatpartially surrounds the intermediate metal layer conductor; wherein thefirst conductor is positioned between a substrate of the die and theintermediate metal layer; a redistribution layer that comprises (a) aredistribution layer conductor that is electrically coupled to aninterface pad of the die, (b) a second capacitor conductive plate, and(c) a redistribution layer dielectric material that partially surroundsthe redistribution layer conductor and the second capacitor conductiveplate; wherein a certain portion of the intermediate metal layerdielectric material is positioned between the first and second capacitorconductive plates; wherein at least the certain portion of theintermediate metal layer dielectric material, the first capacitorconductive plate and the second capacitor conductive plate form a highvoltage capacitor; and wherein the intermediate metal layer conductor isconfigured to supply power to a group of transistors of the die whilethe first conductor is configured to supply power only to a sub-group ofthe transistors of the die.
 2. The die according to claim 1 wherein thedie comprises complementary metal oxide transistors, bipolar transistorand double diffused metal oxide transistors.
 3. The die according toclaim 1 wherein the first capacitor layer is a first metal layer;wherein the first capacitor conductive plate is made of metal; andwherein the first capacitor layer dielectric material partiallysurrounds the first conductor.
 4. The die according to claim 1 whereinthe first capacitor layer is positioned between the substrate of the dieand the first conductor and wherein the first capacitor conductive platecomprises a non-metal conductive material.
 5. The die according to claim4 wherein the non-metal conductive material is silicide.
 6. The dieaccording to claim 1 wherein a thickness of the intermediate metal layerexceeds 30000 Angstrom.
 7. The die according to claim 1 wherein a ratiobetween a thickness of the intermediate metal layer and a thickness ofthe first capacitor layer exceeds three.
 8. The die according to claim 1wherein a thickness of the intermediate metal layer is dictated by apower consumption of the group of transistors.
 9. The die according toclaim 1 wherein a thickness of the intermediate metal layer is setregardless of any electrical parameter of the high voltage capacitor.10. The die according to claim 1 wherein the die is manufactured by amanufacturing process that comprises applying a design rule thatdictates a thickness of the intermediate metal layer as a function of apower consumed by the group of transistors.
 11. The die according toclaim 1 wherein the die is manufactured by a manufacturing process thatcomprises applying a design rule that dictates a thickness of theintermediate metal layer regardless of any electrical parameter of thehigh voltage capacitor.
 12. The die according to claim 1 wherein the dieis manufactured by a complementary metal oxide (CMOS), bipolar anddouble diffused metal oxide (DMOS) manufacturing process.
 13. A methodfor manufacturing a die, the method comprises: manufacturing a substrateand a group of transistors; manufacturing a first capacitor layer thatcomprises (a) a first capacitor conductive plate, and (b) a firstcapacitor layer dielectric material that partially surrounds the firstcapacitor conductive plate; manufacturing an intermediate metal layerthat comprises (a) an intermediate metal layer conductor that is made ofCopper, and (b) an intermediate metal layer dielectric material thatpartially surrounds the intermediate metal layer conductor; wherein themanufacturing of the intermediate metal layer is preceded bymanufacturing a first conductor; manufacturing a redistribution layerthat comprises (a) a redistribution layer conductor that is electricallycoupled to an interface pad of the die, (b) a second capacitorconductive plate, and (c) a redistribution layer dielectric materialthat partially surrounds the redistribution layer conductor and thesecond capacitor conductive plate; wherein a certain portion of theintermediate metal layer dielectric material is positioned between thefirst and second capacitor conductive plates; wherein at least thecertain portion of the intermediate metal layer dielectric material, thefirst capacitor conductive plate and the second capacitor conductiveplate form a high voltage capacitor; and wherein the intermediate metallayer conductor is configured to supply power to a group of transistorsof the die while the first conductor is configured to supply power onlyto a sub-group of the transistors of the die.
 14. The method accordingto claim 13 wherein the manufacturing of the die comprises applying adesign rule that dictates a thickness of the intermediate metal layer asa function of a power consumed by the group of transistors.
 15. Themethod according to claim 13 wherein the manufacturing of the diecomprises applying a design rule that dictates a thickness of theintermediate metal layer regardless of any electrical parameter of thehigh voltage capacitor.
 16. A method for designing a die, the methodcomprises: designing a die that comprises a first capacitor layer thatcomprises (a) a first capacitor conductive plate, and (b) a firstcapacitor layer dielectric material that partially surrounds the firstcapacitor conductive plate; a first conductor; an intermediate metallayer that comprises (a) an intermediate metal layer conductor that ismade of Copper, and (b) an intermediate metal layer dielectric materialthat partially surrounds the intermediate metal layer conductor; whereinthe first conductor is positioned between a substrate of the die and theintermediate metal layer; a redistribution layer that comprises (a) aredistribution layer conductor that is electrically coupled to aninterface pad of the die, (b) a second capacitor conductive plate, and(c) a redistribution layer dielectric material that partially surroundsthe redistribution layer conductor and the second capacitor conductiveplate; wherein a certain portion of the intermediate metal layerdielectric material is positioned between the first and second capacitorconductive plates; wherein at least the certain portion of theintermediate metal layer dielectric material, the first capacitorconductive plate and the second capacitor conductive plate form a highvoltage capacitor; and wherein the intermediate metal layer conductor isconfigured to supply power to a group of transistors of the die whilethe first conductor is configured to supply power only to a sub-group ofthe transistors of the die; and wherein the designing comprises at leastone out of: setting a thickness of the intermediate metal layerregardless of any electrical parameter of the high voltage capacitor;and determining the thickness of the intermediate metal layer inresponse to a power consumed by the group of transistors.